An Introduction to Surface Analysis by XPS and AES

by John F. Watts, John Wolstenholme

An Introduction to Surface Analysis by XPS and AES

Description:

Extensively revised and updated with additional material included in existing chapters and new material on angle resolved XPS, surface engineering and complimentary methods.
* Includes an accessible introduction to the key spectroscopic techniques in surface analysis.
* Provides descriptions of latest instruments and techniques.
* Includes a detailed glossary of key surface analysis terms.

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